View raw STDF binary data files
View/edit all record types, view standardized lot summary report and extra tables showing each unit’s parametric test results from different perspectives.

STDF editing
Edit any record, allowing not only fixes to lotids and waferids, but also fixes to details like test names, limits, test conditions and anything else in STDF.

File exporting
CSV, Excel, JMP JSL (JMP scripting language), HTML and custom formats

Streamlined analysis flows
Faster analysis using data scrubbing for product qualifications and process characterization.

Test condition characterization using DTR records
Just write DTR records with format COND:name=value,name2=value2,…. and turn on test condition option.

Merging of multiple STDF files
Combine final test files from multiple steps or fab wafer sort re-probe sessions into one file for product characterization or to create analysis groups.

Statistical summaries
Can be seen for a few or all tests, including failure percentages, Cpks, medians, alarms and quartiles.

Visualization tools
Histograms, trend charts, scatter plots, box plots, wafer maps, bin and test fail paretos, with a robust set of configurations including outlier removal, up to three levels of grouping, limits drawing, histogram bin selection and more. All graphs can be printed to PDF and PNG files.

Extended Capabilities
More tools such as reporting automation, data collection automation and data architecting are available with upgrade to QuickLoad-Central.

Platform Requirements
QuickEdit is available for Windows, MacOS, Linux and just about any platform that runs a standard version of Java. (For platforms other than Windows and MacOS just download the QuickEdit Linux installer, gzip and untar the download file and use the quickEdit.sh script. This will also work on MacOS if your configuration rejects the installer.)